Three-Dimensional Computerized Stress Analysis of Commercially Pure Titanium and Yttrium-Partially Stabilized Zirconia Implants

Purpose: The purpose of this study was to use three-dimensional finite element analysis to analyze stress distribution patterns in Re-Implant implants made of commercially pure titanium (cpTi) and yttrium-partially stabilized zirconia (YPSZ). Materials and Methods: Two three-dimensional finite element analysis models of a maxillary incisor with Re- Implant implants were made, surrounded by cortical and cancellous bone. A porcelainfused-to-metal crown for the cpTi implant and a ceramic crown for the YPSZ implant were modeled. Stress levels were calculated according to the von Mises criteria. Results: Higher stresses were observed at the area where the implant entered the bone. Stresses were higher at the facial and lingual surfaces than the proximal ones. In cortical bone and at the junction of cortical and cancellous bone, stress distribution presented a pattern of alternating higher (4.0 to 5.0 MPa) and lower (1.3 to 2.0 MPa) stress areas. Higher stresses were found at the apical third of the implant-to-bone junction as well. Conclusion: Re-Implant implants presented a pattern of low, well-distributed stresses along the entire implant-to-bone interface. YPSZ implants had very similar stress distribution to cpTi implants and may be viable esthetic alternatives, especially in maxillary anterior regions.