Seiten: 111-118, Sprache: EnglischMulcahy, Conor / Sherriff, Martyn / Walter, John D. / Fenlon, Michael R.Measurement of misfit at the implant-prosthesis interface is a difficult procedure. One factor common to all methods that attempt to measure 3-dimensional distortion to the micron level is the difficulty in providing verifiably consistent reference points between individual measurement sets. Consequently, the majority of studies use a relative distortion model in which the coordinate reference system is integral to the framework, thus limiting the value of the data gathered. In the method described, the datum plane and the coordinate reference system were set up external to the framework and could be re-established between measurement sets in a verifiable manner.
Schlagwörter: coordinate measuring machine, datum plane, framework, implant
