Seiten: 381-393, Sprache: EnglischDe Smet, Els / van Steenberghe, Daniel / Quirynen, Marc / Naert, IgnaceHigh implant survival rates are published with more than 15 years of observation time. Failures over time are often caused by ongoing marginal bone loss. Therefore, the need for reliable monitoring of the stability of periimplant attachment and/or bone level is extremely important. Marginal bone loss around osseointegrated implants has often been associated with periimplantitis, but clinical observations cannot prove this relationship. Otherwise, the impact of excessive loading on periimplant bone has been shown in animal studies and has been positively related to implant failure in terms of implant mobility and marginal bone loss. Some clinical observations support this hypothesis.